Doctorates' Information System

     Krishna Kumar S.

Ph.D. fromIndian Institute of Technology Kharagpur - Electronics and Electrical Communication Engineering
Supervisor(s)  Dr. Santanu Chattopadhyay, Dr. Pradip Mandal
Ph.D. status  Joined in 2008 :: Completed in 2012
AddressAssoc. Prof in ECE, Amrita School of Engineering, Amrita Nagar P.O., Coimbatore, Tamilnadu. 641112
Phone09789595172
Emailkrishnaks@iitkgp.ac.in
Formal Education
Exam / Degree Board / UnivBranchYear
B.Tech.T.K.M College of Engineering, University of KeralaElectronics and Communication Engineering1995
M.Tech.Indian Institute of Technology Madras, ChennaiComputer Science and Engineering2003

Research Areas
  • Low Power Techniques in Digital Circuit Testing

Teaching Experience
  • Basic Electronics(T) at IIT Kharagpur Spring 2008 (1 terms)
  • Basic Electronics Lab(P) at IIT Kharagpur 2008-2009 (2 terms)
  • Microprocessor Lab(P) at IIT Kharagpur Spring 2009 (1 terms)

Papers Published in Journals
  • Customizing Completely Specified Pattern Set Targeting Dynamic and Leakage Power Reduction During Testing by S. Krishna Kumar, Subhadip Kundu, Santanu Chattopadhyay Integration, the VLSI Journal Accepted for publication (2011)

Papers Presented at Conferences
  • Circuit Partitioning Using Particle Swarm Optimization for Pseudo- Exhaustive Testing by S. Krishna Kumar, P. Uday Bhaskar, Santanu Chattopadhyay, Pradip Mandal Int. Conf. on Advances in Recent Technologies in Communication and Computing, ARTCom 2009, Kottayam, India 346-350 (2009)
  • Low Power Pseudoexhaustive Testing with Cellular Automata by S. Krishna Kumar, P. Uday Bhaskar, Santanu Chattopadhyay International Conference on Advances in Computing, Control, and Telecommunication Technologies, ACT 2009, Trivandrum, India 419-423 (2009)
  • Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption by Subhadip Kundu, S. Krishna Kumar, Santanu Chattopadhyay Asian Test Symposium, ATS 2009, Taiwan 307-312 (2009)
  • Test Power Reduction with Test-Time Trade-Off by Subhadip Kundu, S. Krishna Kumar, Santanu Chattopadhyay IEEE International Symposium on Circuits and Systems, ISCAS 2010, Paris Accepted (2010)
  • Customizing Pattern Set for Test Power Reduction via Improved X-identification and Reordering by S. Krishna Kumar, S. Kaundinya, Subhadip Kundu, Santanu Chattopadhyay 16th International Symposium on Low Power Electronics and Design 2010, ISLPED 2010, Austin, Texas, USA pp.177-182 (2010)
  • Particle Swarm Optimization based Vector Reordering for Low Power Testing by S. Krishna Kumar, S. Kaundinya, Subhadip Kundu, Santanu Chattopadhyay The Sec. Int. Conf. on Computing, Communication and Networking Technologies, ICCCNT 2010, Karur, India pp.1-5 (2010)
  • Particle Swarm Optimization Based Scheme for Low Power March Sequence Generation for Memory Testing by S. Krishna Kumar, S. Kaundinya, Santanu Chattopadhyay Asian Test Symposium, ATS 2010, Shanghai, China pp.401-406 (2010)

Indian Institute of Technology, Kharagpur-721 302, INDIA
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